Fast Laser Photothermal Temperature Measurement System

Testing Capabilities

X-POWER offers a noncontact temperature measurement system to measure temperature in microsecond regime for power electronic devices for fast events e.g. under short-circuit conditions. Commercial temperature measurement systems such as thermocouple, IR camera and fiber optic temperature sensors are not capable to measure temperature in a microsecond regime due to low response time after running a current into a device in a short time (~ 10 μs).

Potential to Research and Industry Service

• Support research on short circuit test to measure temperature of power electronic devices in micro-second regime.
• Measure thermal transport in thermal interface materials.
• Measure temperature of power electronic devices and post failure analysis after thermal cycling.

In Photothermal technique, which is an optical and noncontact method, surface temperature is monitored by focus laser beam on the surface and temperature will be measured as a function of time in microsecond regime. Figure 1 shows the schematic diagram and 3D image of the temperature measurement setup