Fast and Ultra-fast Infrared Thermal Characterization System

Testing Capabilities

X-Power is equipped with a Thermal Characterization setup for power electronic circuits and components. This setup enables the thermal characterization of power electronics in real operation as well as reliability testing. The setup includes the following equipment:

High Sensitive, High-speed, High Definition Mwir Camera Flir X8501sc with a 3-5 Um, 3x Microscope Lens

 

Specifications

• Detector Type indium antimonide (InSb)
• Spectral Range 3.0 – 5.0 μm 
• 1280 x 1024 resolution high-speed imaging
• Frame rate (Full Window) programmable: 0.0015 Hz to 180 Hz
• Standard temperature range -20°C to 350°C
• Operating Temperature Range -20°C to 350°C
• Up to 36 seconds of on-camera RAM recording with FLIR DVIR
• Synchronization with other instruments and events
• Full GenICam support over GigE, CXP, and Camera Link interfaces
• Four-position motorized filter wheel with automatic filter recognition
• 3X microscope lens, f/2.5 HDC Bayonet

High Speed Mwir Camera Infra-tec Imageir 5300

Specifications​

• Detector Type Indium antimonide (InSb)
• Spectral Range 2.0 – 5.5 μm
• Cooled FPA photon detector with (320 × 256) IR pixels
• Full frame rate: up to 481 Hz
• Half frame: up to 1,906 Hz
• Quarter frame: up to 7.2 kHz
• Line: up to 45.4 kHz
• Line (64x2): up to 105 kHz
• Snapshot detector, internal trigger interface
• Extremely short integration times in the microsecond range
• Thermal resolution up to 0.015 K
• Standard Temperature Range -40°C to 1200°C
• Operating Temperature Range -20°C to 50°C

Thermal Camera Positioning System

Specifications

• Cross table 2-axis-system: 2-axis-system for horizontal and vertical positioning for thermographic systems
• Horizontal and vertical structure
• Motor-controlled
• Programmable point-to-point-control
• Load capacity class: 5 kg
• Speed rating: 0.1 m/sec.
• Precision class: 0.1 mm