Supervisor:
Frede Blaabjerg

Co-Supervisor:
Francesco Iannuzzo

Assessment Committee:
Kjeld Pedersen (Chair)
Pia Lindh, Laaparenta University of Technology, Finland
Professor Saeed Jahdi, University of Bristol

Moderator:
Huai Wang

Abstract:

The rapid development of power electronics technology has led to its widespread use in fields such as renewable energy generation and traction systems. However, this growth has also introduced significant reliability challenges for power electronic components operating under varied stress factors, paving the way for a new era in reliability analysis and testing. A key question arises: What are the key limitations of current reliability testing methods for power electronic components, and how can they be improved for more application-oriented assessments? Accordingly, this Ph.D. project focuses on developing an application-oriented reliability testing method for power semiconductor devices that are most critical to the reliability of power electronic systems. The findings of this project contribute to a deeper understanding of power semiconductor reliability under real-world stress conditions and offer advancements in testing methodologies.